ACM SAC TRECK Track

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12th ACM SAC TRECK Track
Trust, Reputation, Evidence and other Collaboration Know-how

Deadline Extended: 21th of September 2015


The proceedings are published by ACM in both printed form and CD-ROM. 
They are also available on the Web through the ACM Digital Library.
The best papers may also be published in a Journal Special Issue, e.g. ACR (Applied Computing Review) in 2010. A special issue of the IFIP Trust Management Journal is planned to be published in 2016 including the best ACM SAC TRECK track papers of previous years and 2016! Contact us if you want to submit an extended version of a previous TRECK paper to this special issue.

This year, we have a special focus on Bring Your Own Device (BYOD) and corporate security, trust, risk and privacy so those kinds of contributions are especially welcome!

The FP7 MUSES (Multiplatform Usable Endpoint Security) project investigates BYOD and corporate security, trust, risk and privacy and sponsors the ACM SAC'15 TRECK track!



We would like to emphasize that we may accept the submission of industrial experience reports,
commercial tools case studies and reports of innovative computing applications if they are written in a scientific way.

ACM SAC TRECK 2016 at Pisa, Italy!

Cathedral and Campanile - Pisa 2014 (2) crop.JPG
"Cathedral and Campanile - Pisa 2014 (2) crop" by © José Luiz Bernardes Ribeiro / . Licensed under CC BY-SA 3.0 via Commons.


Paper registration is required, allowing the inclusion of the paper/poster in the conference proceedings. An author or a proxy attending SAC MUST present the paper: This is a requirement for the paper/poster to be included in the ACM/IEEE digital library. No-show of scheduled papers and posters will result in excluding them from the ACM/IEEE digital library.


Members of the ACM SAC TRECK track 2016 Program Committee:

Track Co-Chairs:
Ronald Petrlic, Saarland University, Germany
Jean-Marc Seigneur, Medi@LAB, ISS, ISI, SdS, GSEM, CUI, University of Geneva, Switzerland

Track Program Committee :
Anirban Basu, KDDI R&D Laboratories, Japan
Yung Shin Van Der Sype, ICRI-KU Leuven, Belgium
Uwe Roth, Luxembourg Institute of Science and Technology
Ricardo Neisse, European Commission Joint Research Center, Belgium
Christian Damsgaard Jensen, Technical University of Denmark
Yanjun Zuo, University of North Dakota, USA
Joerg Abendroth, Nokia Siemens Networks, Germany
Stephen Marsh, University of Ontario Institue of IT, Canada
Masakatsu Nishigaki, Shizuoka University, Japan
Alessandro Aldini, University of Urbino, Italy
Christoph Sorge, Saarland University, Germany
Xavier Titi, University of Geneva, Switzerland
Sheikh Mahbub Habib, Technical University Darmstadt, Germany
Rafael T. de Sousa Jr., University of Brasília, Brazil